Date/Time
Date(s) - 07/27/2021
1:00 pm - 3:00 pm
Categories No Categories
Abstract:
Diagnosing faults in military electronics can be a time-consuming, imprecise, and difficult process. Reported electronics errors that occur in an operational working environment, often show No Fault Found (NFF) when tested later at a higher level of maintenance. There are many know causal factors for NFF including training, inadequate troubleshooting procedures and tools, OPTEMPO sortie requirements, and intermittence. This JTEG forum will take a deep dive into these common causal factors of NFF and explore emerging tools, technologies, and processes aimed at rapidly and precisely isolating traditional “solid-state” electronic faults such as opens and shorts. This session will also delve into intermittence as a significant cause of electronics NFF. Intermittence occurs randomly in time, place, amplitude, and duration. These intermittent faults are a significant problem for the US Department of Defense (DoD), contributing as a leading driver of weapon system non-availability and responsible for billions of dollars in sustainment costs annually. Traditional testing equipment and methods are not adequate to identify these intermittent faults. However, with the use of proper test equipment, it is now possible to perform diagnostics on these formally NFF electronics and reliably detect intermittent faults. This virtual technology forum will provide examples of diagnostic equipment, some currently in use within the military Services, and others currently being developed and demonstrated.
Agenda
1300-1305: Welcome – Ray Langlais (OSD-MR) Presentation
1305-1309: Administrative Notes – Debbie Lilu (NCMS)
1309-1335: Intermittent Fault Detectors – Ron Swindle (Crane) & Ken Anderson (Universal Synaptics)
1335-1355: Advanced Wiring Test Set – Phil Mathis (160th SOAR) & Brian Cyrier (Eclypse) Presentation 1 Presentation 2
1355-1415: Distributed Acquisition Digital Twin Maintenance Architecture (DADTMA) – Damon Blanchette (FTL Labs)
1415-1435: Acoustic Ultrasound Detection – Robert Broche (Ctrl Systems) Presentation
1435-1455: AMUET 4.0 Applications – Alain Lussier & Patrick Cobb (WR-ALC)
1455-1500: Wrap-Up – Ray Langlais (OSD-MR) Presentation
Connect
Enter as a guest on AdobeConnect at: https://ncms.adobeconnect.com/jteg/
Additionally, we will be using a separate audio line through Conference America. Call: 888-537-7715, Conference ID: 16161715#”