On 19 January 2016 the JTEG will conduct a technology forum on “Integrated Circuit Test, Repair and Re-Manufacturing”. The purpose of the forum is to share information on new and developing capabilities designed to test and/or repair/replace integrated circuits, with the goal to improve equipment operational availability, ensure IC lineage, combat obsolescence and to significantly reduce the turn-in of No Fault Found (NFF) /Can Not Duplicate (CND) of certain electronic modules and shop replaceable assemblies to the depot. The forum discussion will include low cost test routines that can be developed and fielded quickly, drop-in replacements for obsolete integrated circuits, and detection of defective and counterfeit integrated circuits.
